内标法-电感耦合等离子体发射光谱法测定硅酸盐中的二氧化硅
Determination of Silicon Dioxide in Silicates by Internal Standard Method-Inductively Coupled Plasma Emission pectroscopy
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摘要: 二氧化硅含量是硅酸盐全分析中最常测定的项目之一,目前常用的测定方法是重量法。该方法流程长,操作复杂,条件严格,分析效果并不理想。本文介绍一种快速测定硅酸盐中二氧化硅含量的新方法。通过加入内标溶液,采用基体匹配法相结合的方法,使得基体复杂,含量较高的二氧化硅可以通过电感耦合等离子体发射光谱仪测定。方法选择了251.611nm的谱线,选取铬元素作为内标元素,选取了三个国家一级标准物质进行实验,并进行了不同方法之间的比对。经验证,该方法的精密度和准确度均可满足实验要求。该方法操作流程简便,极大提高了硅酸盐全分析项目的效率,内标法和基体匹配法相结合,有效减少了仪器波动及基体效应对结果带来的影响,也为其他高含量样品的检测提供了思路。Abstract: The determination of the silicon dioxide content is a critical parameter in the comprehensive analysis of silicates,and the gravimetric method is commonly utilized.Nevertheless,this method is characterized by a lengthy process,intricate operation,and strict conditions,which result in suboptimal analytical outcomes.This study presents a new approach for the rapid determination of the silica content in silicates.By integrating the internal standard method with inductively coupled plasma emission spectrometry,the silica content can be determined in the presence of complex matrices and high concentrations.A spectral line of 251.611 nm was selected,chromium was chosen as the internal standard element,and three national-level standards were utilized for the experiments.The results were compared with those obtained using other methods,demonstrating that the precision and accuracy of the proposed method satisfied experimental requirements.Furthermore,the method is user friendly and significantly enhances the efficiency of the overall analytical program for silicates.The combination of the internal standard and matrix matching methods effectively mitigates the effects of instrument fluctuations and matrix interferences on the results and provides a framework for the analysis of other samples with high content.