Determination of Silicon Dioxide in Silicates by Internal Standard Method-Inductively Coupled Plasma Emission pectroscopy

The determination of the silicon dioxide content is a critical parameter in the comprehensive analysis of silicates,and the gravimetric method is commonly utilized.Nevertheless,this method is characterized by a lengthy process,intricate operation,and strict conditions,which result in suboptimal analytical outcomes.This study presents a new approach for the rapid determination of the silica content in silicates.By integrating the internal standard method with inductively coupled plasma emission spectrometry,the silica content can be determined in the presence of complex matrices and high concentrations.A spectral line of 251.611 nm was selected,chromium was chosen as the internal standard element,and three national-level standards were utilized for the experiments.The results were compared with those obtained using other methods,demonstrating that the precision and accuracy of the proposed method satisfied experimental requirements.Furthermore,the method is user friendly and significantly enhances the efficiency of the overall analytical program for silicates.The combination of the internal standard and matrix matching methods effectively mitigates the effects of instrument fluctuations and matrix interferences on the results and provides a framework for the analysis of other samples with high content.